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Author: Milton Ohring
ISBN : B008CYA2GI
New from $127.99
Format: PDF
Posts about Download The Book Reliability and Failure of Electronic Materials and Devices [Kindle Edition] Free Download for everyone book with Mediafire Link Download LinkSuitable as a reference work for reliability professionals or as a text for advanced undergraduate or graduate students, this book introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices.
Reliability and Failure of Electronic Materials and Devices integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation, and the statistical handling of lifetime data. Electromigration, dielectric radiation damage and the mechanical failure of contacts and solder joints are among the failure mechanisms considered. An underlying thread of the book concerns product defects--their relation to yield and reliability, the role they play in failure, and the way they are experimentally exposed.
The reader will gain a deeper physical understanding of failure mechanisms in electronic materials and devices, acquire skills in the mathematical handling of reliability data, and better appreciate future technology trends and the reliability issues they raise.
Key Features
* Discusses reliability and failure on both the chip and packaging levels
* Handles the role of defects in yield and reliability
* Includes a tutorial chapter on the mathematics of reliability
* Focuses on electromigration, dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, radiation damage and the mechanical failure of packages, contacts, and solder joints
* Considers defect detection methods and failure analysis techniquesBooks with free ebook downloads available Reliability and Failure of Electronic Materials and Devices Free Download
- File Size: 12402 KB
- Print Length: 692 pages
- Publisher: Academic Press; 1 edition (June 12, 1998)
- Sold by: Amazon Digital Services, Inc.
- Language: English
- ASIN: B008CYA2GI
- Text-to-Speech: Enabled
X-Ray:
- Lending: Not Enabled
- Amazon Best Sellers Rank: #1,762,979 Paid in Kindle Store (See Top 100 Paid in Kindle Store)
Reliability and Failure of Electronic Materials and Devices Free Download
I have a filing cabinet full of papers on various aspects of materials reliabilty: solder stress calculations, mechanical behavior, diffusion, corrosion mechanisms, etc. Professor Ohring's book neatly summarizes all of that into one coherent text, covering topics such as electromigration, electrostatic discharge, solder mechanics, corrosion, semiconductor devices and more. But rather than touch on the practical aspects of these failure modes, as do several reliability books I already own, he delves into the underlying fundamental mechanisms involved, providing equations and explanations. This is why I consider Ohring's book a true textbook on the subject. The detailed explanations are valuable to me in that they provide a springboard from which to analyze more complex issues. For anyone involved with reliability of materials in electronics, I highly recommend this book. And one more thing: in some places Prof. Ohring writes with a refreshing informality. For example, he talks about defects and KILLER DEFECTS (his words and capitalization!). I just laughed when I saw that.
By jk jlk
This book has the rare quality to be complete and essential. It helped me a lot on my job having found in it a lot of useful informations. I still use it as a reference on the need.
Particularly, Chapter 11 (Characterization and failure analysis of material and devices) gives detailed explanations about the most commoms failure mechanisms and suggests a useful analysis procedures. Moreover a comprehensice list of possible analysis techniques are explained to the reader.
This book is without any doubt a well done job!
By Paolo Giai Miniet
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